The commonly used detection instruments for analyzing the composition of nanomaterials include:
1. ICP (Inductively Coupled Plasma): ICP is a technology widely used in the fields of analytical chemistry and materials science. It can be used to determine the content and composition of elements in nanomaterials. By converting the sample into gaseous ions and using the generated plasma spectrum to determine the concentration of the elements. ICP-MS (Inductively Coupled Plasma Mass Spectrometer) combines ICP and mass spectrometry techniques to analyze extremely low concentrations of elements in nanomaterials.
2. XRF (X-ray Fluoroscopy): XRF is a widely used technology for material analysis and non-destructive testing. It determines the composition of elements by irradiating the surface or interior of the sample with X-rays and measuring the fluorescence radiation of element characteristics in the sample. XRF is suitable for a range of nanomaterials, including solid, liquid, and powder samples.
3. EDS (Energy Dispersive X-ray Spectroscopy): EDS is an electron microscopy technique that determines the composition of elements in a sample by measuring the X-rays generated by the interaction between the electron beam and the sample in the material. EDS is often used in conjunction with scanning electron microscopy (SEM) to provide surface composition analysis of nanomaterials.